Selected publications:


Müller-Caspary, K. ; Duchamp, M. ; Rösner, M. ; et al
Atomic-scale quantification of charge densities in two-dimensional materials
Physical Rev. B; DOI:

Fatermans, J.; den Dekker, A. J.; Müller-Caspary, K.; Lobato, I.; O’Leary, C.; Nellist, P. D. & Van Aert
S. Single atom detection from low contrast-to-noise ratio electron microscopy images
Phys. Rev. Lett.; DOI:

Verbeeck, J.; Béché, A.; Müller-Caspary, K.; Guzzinati, G.; Luong, M. A. & Den Hertog, M.
Demonstration of a 2×2 programmable phase plate for electrons
Ultramicroscopy; doi: 10.1016/j.ultramic.2018.03.017

Chatterjee, D.; Shetty, S.; Müller-Caspary, K.; Grieb, T.; Krause, F. F.; Schowalter, M.; Rosenauer, A. & Ravishankar, N.
Ultrathin Au Alloy Nanowires at the Liquid Liquid Interface
Nano Letters; doi: 10.1021/acs.nanolett.7b05217

Müller-Caspary, K.; Oppermann, O.; Grieb, T.; Krause, F. F.; Rosenauer, A.; Schowalter, M.; Mehrtens, T.; Beyer, A.; Volz, K. & Potapov, P. Materials characterisation by angle-resolved scanning transmission electron microscopy
Scientific Reports, The Author(s), doi: 10.1038/srep37146 (2016)

Müller-Caspary, K.; Oelsner, A. & Potapov, P. Two-dimensional strain mapping in semiconductors by nano-beam electron diffracion employing a delay-line detector
Applied Physics Letters;

Müller-Caspary, K.; Krause, F. F.; Grieb, T.; Löffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J. & Rosenauer, A.
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy Ultramicroscopy; doi: 10.1016/j.ultramic.2016.05.004

Müller, K.; Krause, F. F.; Béché, A.; Schowalter, M.; Galioit, V.; Löffler, S.; Verbeeck, J.; Zweck, J.; Schattschneider, P. & Rosenauer, A.
Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction
Nature Communications; doi: 10.1038/ncomms6653 (2014)

Rosenauer, A.; Krause, F. F.; Müller, K.; Schowalter, M. & Mehrtens, T.
Conventional Transmission Electron Microscopy Imaging beyond the Diffraction and Information Limits
Phys. Rev. Lett., American Physical Society;

Roy, A.; Kundu, S.; Müller, K.; Rosenauer, A.; Singh, S.; Pant, P.; Gururajan, M. P.; Kumar, P.; Weissmüller, J.; Singh, A. K. & Ravishankar, N.
Wrinkling of Atomic Planes in Ultrathin Au Nanowires
Nano Letters; DOI: 10.1021/nl502259w

Müller, K.; Ryll, H.; Ordavo, I.; Ihle, S.; Strüder, L.; Volz, K.; Zweck, J.; Soltau, H. & Rosenauer, A.
Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled device
Applied Physics Letters, AIP;